Image d’illustration
Atomic resolved STEM–ADF images to reveal the distribution of different point defects. (a) Antisite defects in PVD MoS2 monolayers. Scale bar, 1 nm. (b) Vacancies including VS and VS2 observed in ME monolayers, similar to that observed for CVD sample. Scale bar, 1 nm
Par Jinhua Hong et al. — http://www.nature.com/ncomms/2015/150219/ncomms7293/abs/ncomms7293.html, CC BY 4.0, https://commons.wikimedia.org/w/index.php?curid=39214506
- Enseignant: Béchir Slimi
- Enseignant: Yann Tison
- Enseignant: Florent Voisin